Surface morphology、Dimension Measurement 表面形貌、尺寸量测
Optical profiler, SEM, TEM
Film type and thickness 薄膜类型及薄膜厚度
SEM/EDS, TEM/EDS
Q-well structure 量子井结构分析
SEM/EDS, TEM/EDS
Defects (Dislocations) 缺陷分析
TEM
Q-Well Periodic Doping Profile 量子井周期掺杂分布
SIMS
Defect Isolation 缺陷定位
EMMI、OBIRCH
Failure Analysis 失效分析
X-ray,SAM,EMMI,SEM,FIB,TEM
ESD Testing 静电测试
可靠性测试